F. Driussi, S. Venica, A. Gahoi, A. Gambi, P. Giannozzi, S. Kataria, M.C. Lemme, P. Palestri, and D. Esseni
DOI: 10.1016/j.mee.2019.111035
https://air.uniud.it/bitstream/11390/1151128/5/finalMEE_INFOS2019_short.pdf
Microelectronic Engineering 216, 111035 (2019)